This dashboard analyzes semiconductor manufacturing sensor data from the UCI SECOM dataset, visualizing fault detection with a dark-themed layout. It combines four Chart.js (v4.4.1) canvas charts: two donut charts showing class balance and feature quality, a horizontal bar chart ranking top sensors by Cohen's d effect size, and a distribution chart for the strongest feature. The code dynamically loads Chart.js from a CDN and uses custom legends, HTML/CSS stat cards, and responsive grid styling.